HIGHLIGHTS
Real-time and easy-to-use
Accurate single-point measurement of sheet
resistance for conductive thin films (Ohm/sq)
Layer thickness measurement of metal films (nm)
Substrate thickness monitoring of conductive
substrates (µm)
Emissivity conversion
Wireless data transfer via Bluetooth
Data Center to manage and visualize data from
different portable systems
Easy to use software
APPLICATIONS
> Architectural glass (LowE)
> Touch screens & flat monitors
> LED applications
> Smart-glass applications
> Transparent antistatic foils
> Photovoltaics
> De-icing & heating applications
> Batteries & fuel cells
> Packaging materials
> Printed Electronics
> ITO/ TCO/ Nanowires
> Metal mesh & metal layers