Non-Contact Sheet Resistance Tester

HIGHLIGHTS
 Contact-free & real-time
 Accurate single-point measurement of sheet
resistance for conductive thin films (Ohm/sq)
 Layer thickness measurement of metal films (nm)
 Layer and substrate thickness monitoring (µm)
 Characterization of multilayer systems on request
 Manual mapping of sheet resistance guided by
an easy-to-handle software

APPLICATIONS
> Architectural glass (LowE)
> Touch screens & flat monitors
> OLED & LED applications
> Smart-glass applications
> Transparent antistatic foils
> Photovoltaics
> Semiconductors
> De-icing & heating applications
> Batteries & fuel cells
> Packaging