Automated AFM

HIGH RESOLUTION IMAGING:
R&D 100
Award Winner 2009
ADVANCED AFM AND STM
CHARACTERIZATION TECHNIQUES

NEXT has 25 fm/√Hz optial deflctin noise level.
This level of performance is driving advanced highresolutin imaging capabilitis. Metiulously elegant

NEXT mechanical design, together with the low noise
level of the closed loop piezoscanner, thermally
stabilized acousti enclosure and high vibratin
tolerancy make high resolutin imaging a routie
procedure.

Two automatially interchangeable measuring
heads (AFM and STM) are integrated into the
NEXT. Driven by the new digital PX Ultra controller
the NEXT delivers the broadest range of AFM
and STM techniques - for sample topography,
electrical, magneti and nanomechanical propertis
characterizatin. Multirequency AFM techniques
dramatially increase the amount of informatin
acquired from single experiment.

NEXT provides motorized sample positining and
integrated high resolutin optial microscope
positining, motorized contiuous zoom and focusing
of the optial microscope. But AFM automatin
is more than motorizatin. The smart automati
alignment algorithm provides fast laser-cantieverphotodiode optial chain alignment turning this
routie procedure into single click 10 second
operatin. Powerful softare automatin features
drive AFM productiity to a new level.