Automated Test Equipment (ATE) : QT2256 - 320 PXI - Combination Board Testers

• Edge Connector Functional Test and Guided Probe Back tracking. Optional Fault coverage report and Fault dictionary.
• In-Circuit Test capability of Digital / Analog / Mixed Signal devices using Force Drive Pin Electronics.
• Four Analog channels with 12 bit DAC and ADC and 40MHz sampling rate multiplex able to all test channels.
• Precision Measurement Units for enhanced fault coverage and reduced field returns.
• DC Parametric Tests. – Measurement of Input Bias Current, Fan out and Tri-State leakage test.
• AC Parametric Tests. - Measurements of Frequency, Pulse Width, Propagation delay, Rise / Fall times.
• Bus Cycle Signature system for CPU Based boards for Learn and Compare digital signatures without having to write TPS.
• Integrated Boundary Scan Test along with ATE pin electronics for Interconnect and functional Test of Non Boundary Scan devices through virtual test pins.
• In-Circuit Emulation Capabilities.
• Integrated PXI Instruments for RF and extended tests.
• External GPIB based Instrument integration.
• Test access through Clips / Probes, bed of nail fixtures, edge connectors and JATG port.
• 4 Digital Highways for measurement of Frequency, Pulse Width, Propagation delay between signals and Rise / Fall time.
• 12 Analog highways of 30MHz band width for connecting terminals of external Instruments to any of the 320 test pins.
• Test Program Migration form Different other Platform to Qmax System.
• Test-Jig adopters for system self-test and calibration.
• Four RF connectors direct from fixture to Instruments without switching.
• VPC Mass Interconnect adapter with 16 bit fixture ID, Signal pins, Power and RF Connectors.
• 5 Data formats for drive edge placement. NRZ, RZ, RO, RZ and SBC.
• Automatic Fault Simulation in Simulator based Test programs.
• Integrated VHDL Simulator as per IEEE standards.
• Paperless Repair Station.

CircuitTracer (Optional) This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Optional Library:Russian Libray / Military Part Code Library.
Boundary Scan Software:: Includes Chain detection, Chain integrity test, Device ID, User ID, Interconnect test in Interacive and additionally Interconnect test between JTAG pins and Physical test pin / edge connector, Functional test for non boundary scan devices in berween JTAG devices and between JTAG and edge connector devices including Guided probe back tracking in advanved Boundary Scan test software.
Bus Cycle Signature System (BCSS) Software:Learns DIgital signatures from a known good CPU based board to compare with that of a suspected board to find the fault up to node level in the CPU Kernal, without having to write compex TPS or use of expensive and complex simulation modules for CPUs.

• Complete Repair Station for Third Part Maintenance as a Combinational Board tester.
• Full Board Functional Testing through Card Edge for LRUs (Line Replaceable units).
• As a Bed of Nail In-Circuit Tester in production lines.
• Inward Goods Inspection for Digital / Analog / Mixed Signal Devices for stringent Quality Control that includes function, DC and AC Parameters.
• Testing of Board populated with a mixture of High Pin count Boundary Scan Compatible Devices and non boundary scan devices.
• In-House maintenance wings of Defense Establishments.
• Electronic manufacturing units for Board recovery and Production line testing.
• Transporation sector such as MRTs, Railways, Aircraft, Ships etc.
• Hi-tech Defense / Atomic /Space labs and R&D labs for maintenance of sophisticated instrumentation/equipment.
• Useful as Lad Equipment in Test Engineering Courses offered by Universities, technical educational institutions ,Engineering Colleges and Polytechnics