QT1100 is capable of testing any 5v Logic device functionally in as wired “in-circuit” condition using a huge Vast library that defines the functionality of the device in QDDL hardware description language with pre-defined test vectors. No matter what in-circuit configuration is the device under test is, Qmax’s innovative auto compensation modifies the test vector to suit the device configuration on the fly and its evaluation engine validates each output for the corresponding input present and device functionality. QT1100 uses the back-driving or node-forcing technique to functionally test devices in-circuit. Its Auto Guarding Guide helps user to isolate those Bus devices that could potentially interfere with the Bus Device Under Test. This is also extended to OC / OE devices with wired-OR function.
QT1100 also offers QSM VI technique to test custom devices on board that cannot be functionally tested due to lack of information on the functionality. QSM VI captures traces by driving a user Selected current limited sine wave between any two nodes of the DUT and plotting the voltage Vs. current trace. For enhanced fault coverage, QSM VI is capable of capturing traces with any of the DUT pins kept as the reference pin. QSM VI helps detect ESD induced failures.
The Board Learn mode is used to learn the device’s functionality and clip status / link information from a Known Good Board (KGB) and store in a database file for the future use. A faulty board of identical type can be compared with the learnt board using the Board Test Mode, thus increasing the fault coverage. QT1100 provides the facility to create a visual board layout on the screen.
QT1100 has an in-built Short Locator to detect faulty components causing power line shorts or bus line shorts, which cannot be detected using conventional multi-meters. Using the 4-wire measurement technique, it can home-on to the faulty component causing the illegal short. It offers three ranges of measurement at 200 milliOhms2 Ohms and 20 Ohms. The measured resistance value is conveniently displayed as a digital read-out and as a bar graph display.
The built-in Resistance, Capacitance, Voltage (RCV) Measurement mode is capable of measuring RCV values using Probe and Reference pins. QT1100 is also equipped with two channel oscilloscope with maximum sampling rate of 500 KHz. The trigger options include auto, normal, single, positive and negative trigger.
CircuitTracer
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is also an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment. There are three modes in this package, namely.
QDDL : Qmax Device Description Language, which is mainly used for generating test program for SSI / MSI devices.using logic primitives and simple commands.
WEST : Waveform Event Specification & Testing is for LSI/VLSI ICs. Test Program generation using WEST requires Training and it is similar to C language.
GTPG : In Graphical Test Program Generation mode the user can directly define the required test input waveforms for the Device Under Test or even for the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
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