Qmax V2200 Desk Top ATE system

Qmax V2200 Desk Top ATE system is the best solution for ATE Labs. ATE V2200 system is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities for conventional PCBs. It can perform as In–Circuit Device / Cluster test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed.

It has in-built 20MHz 12bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices. Integrated Boundary Scan Test controller (Up to 2 Chains) and software package can be used to test today’s PCBs with high density / high pin count devices. Uses latest technology Boundary Scan hardware with RAM based drivers / sensors in synchronization with ATE digital and analog pin drivers. To effectively test CPU based boards without excluding the CPU from the test, the system offers optional Qmax patented Bus Cycle Signature System. In-Circuit Emulator Support for testing DSP based Board Function.

Parametric Measurement Units (PMU) enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity and Tri-state leakage currents to further enhance fault coverage and avoid unwanted field returns. Optional AC Parametric Tests for propagation delay, rise / fall time and pulse width measurements. Both DC and AC parameters are read from the Device Library and hence loose devices can be tested for both functionality as well as DC and AC parameters as specified in their data sheet. This feature is extreamy useful in Stringent In-coming QC applications.

The capabilities can be further enhanced with optional IEEE instrumentation or PXI based Instrumentation and control through TestDirector 6 software. Analog Highways and relay matrix modules are used in routing the test pin to external measurement IEEE or PXI Instruments of user choice. Uses Virginia Panel Test adapter Interface for highly reliable Unit Under Test (UUT) Interface Panel provides up to 384 signal pins, 19 power (50A each) and 19 RF connectors. The ATE is interfaced to an external Host PC using a 32 bit, 33MHz PCI interface card or PCI Express.

It is a modular design with upgrade options. The basic system comes with 128 Universal Channels programmable for High Current Pin Driver or 50 Ohms source impedance, 8 Flying channels 4 Analog channels and 5 fixed UUT power supplies. It can be easily upgraded to 160 or more Digital Channels with Programmable UUT power supplies, IEEE or PXI External Instrumentation, Bus Cycle Signature System, ICE and Integrated Boundary Scan Test.